This course aims at undergraduate students who have interest in
knowledge of synchroton-based hard and soft
x-ray techniques to study chemical
speciation and atomic and electronic structure of condensed matter.
Students who may
benefit from the course include those with background in physics,
chemistry, geological science, or chemical engineering.
This course will introduce students to the basic forms of
photon and electron
spectroscopy, focusing on methods frequently used for the
analysis of materials. The
course material will cover the physical basis of these methods,
representative examples of
chemical applications, and an overview of new developments. Essay and
assignments will be used to address specific methods in greater depth,
opportunity to explore new methods of relevance to the student's
1. Develop fundamental understanding of the complex
problem of interaction of
radiation and matter.
2. Studying state of the art examples of soft x-ray
((N)EXAFS, XANES,ARPES,PES, XES, RIXS). The
students will particularily
learn which physical or chemical properties
are probed with each spectroscopy
3. Developing sensitivity for the problems in spectroscopy
both, experimentally and
4. Detectors for photons and photoelectrons.
A single final exam will be given. There
will be no midterm exams. The final grade will
be calculated from the partial grades of all
assignments (50%) and the final exam (50%).